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Title: Trap-Related Parametric Shifts under DC Bias and Switched Operation Life Stress in Power AlGaN/GaN HEMTs.

Conference ·
OSTI ID:1145677

Abstract not provided.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1145677
Report Number(s):
SAND2014-4202C; 518350
Resource Relation:
Conference: Proposed for presentation at the International Reliability Physics Symposium held June 1-5, 2014 in Waikoloa, HI.
Country of Publication:
United States
Language:
English