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Title: Flip-Chip and Backside Techniques Seminar ISTFA '09.

Abstract

Abstract not provided.

Authors:
;
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1141916
Report Number(s):
SAND2009-5479C
507625
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the International Symposium for Testing and Failure Analysis held November 15-19, 2009 in San Jose, CA.
Country of Publication:
United States
Language:
English

Citation Formats

Cole, Edward Isaac,, Barton, Daniel L., and Bernhard-Hofer, Karoline. Flip-Chip and Backside Techniques Seminar ISTFA '09.. United States: N. p., 2009. Web.
Cole, Edward Isaac,, Barton, Daniel L., & Bernhard-Hofer, Karoline. Flip-Chip and Backside Techniques Seminar ISTFA '09.. United States.
Cole, Edward Isaac,, Barton, Daniel L., and Bernhard-Hofer, Karoline. 2009. "Flip-Chip and Backside Techniques Seminar ISTFA '09.". United States. https://www.osti.gov/servlets/purl/1141916.
@article{osti_1141916,
title = {Flip-Chip and Backside Techniques Seminar ISTFA '09.},
author = {Cole, Edward Isaac, and Barton, Daniel L. and Bernhard-Hofer, Karoline},
abstractNote = {Abstract not provided.},
doi = {},
url = {https://www.osti.gov/biblio/1141916}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Sat Aug 01 00:00:00 EDT 2009},
month = {Sat Aug 01 00:00:00 EDT 2009}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

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