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Title: A Framework to Quantify FPGA Design Hardness Against Radiation-Induced Single Event Effects.

Conference ·

Abstract not provided.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1141664
Report Number(s):
SAND2014-2449C; 506491
Resource Relation:
Conference: Proposed for presentation at the Midwest Symposium on Circuits and Systems held August 3-6, 2014 in College Station, TX.
Country of Publication:
United States
Language:
English