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Title: Spatially resolved thermal desorption/ionization coupled with mass spectrometry

Abstract

A system and method for sub-micron analysis of a chemical composition of a specimen are described. The method includes providing a specimen for evaluation and a thermal desorption probe, thermally desorbing an analyte from a target site of said specimen using the thermally active tip to form a gaseous analyte, ionizing the gaseous analyte to form an ionized analyte, and analyzing a chemical composition of the ionized analyte. The thermally desorbing step can include heating said thermally active tip to above 200.degree. C., and positioning the target site and the thermally active tip such that the heating step forms the gaseous analyte. The thermal desorption probe can include a thermally active tip extending from a cantilever body and an apex of the thermally active tip can have a radius of 250 nm or less.

Inventors:
; ;
Publication Date:
Research Org.:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1082741
Patent Number(s):
8,384,020
Application Number:
12/890,225
Assignee:
UT-Battelle, LLC (Oak Ridge, TN); University of Tennessee Research Foundation (Knoxville, TN)
DOE Contract Number:  
AC05-00OR22725
Resource Type:
Patent
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION

Citation Formats

Jesse, Stephen, Van Berkel, Gary J, and Ovchinnikova, Olga S. Spatially resolved thermal desorption/ionization coupled with mass spectrometry. United States: N. p., 2013. Web.
Jesse, Stephen, Van Berkel, Gary J, & Ovchinnikova, Olga S. Spatially resolved thermal desorption/ionization coupled with mass spectrometry. United States.
Jesse, Stephen, Van Berkel, Gary J, and Ovchinnikova, Olga S. 2013. "Spatially resolved thermal desorption/ionization coupled with mass spectrometry". United States. https://www.osti.gov/servlets/purl/1082741.
@article{osti_1082741,
title = {Spatially resolved thermal desorption/ionization coupled with mass spectrometry},
author = {Jesse, Stephen and Van Berkel, Gary J and Ovchinnikova, Olga S},
abstractNote = {A system and method for sub-micron analysis of a chemical composition of a specimen are described. The method includes providing a specimen for evaluation and a thermal desorption probe, thermally desorbing an analyte from a target site of said specimen using the thermally active tip to form a gaseous analyte, ionizing the gaseous analyte to form an ionized analyte, and analyzing a chemical composition of the ionized analyte. The thermally desorbing step can include heating said thermally active tip to above 200.degree. C., and positioning the target site and the thermally active tip such that the heating step forms the gaseous analyte. The thermal desorption probe can include a thermally active tip extending from a cantilever body and an apex of the thermally active tip can have a radius of 250 nm or less.},
doi = {},
url = {https://www.osti.gov/biblio/1082741}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Feb 26 00:00:00 EST 2013},
month = {Tue Feb 26 00:00:00 EST 2013}
}

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