Fluorescent microthermal imaging-theory and methodology for achieving high thermal resolution images
The fluorescent microthermal imaging technique (FMI) involves coating a sample surface with an inorganic-based thin film that, upon exposure to UV light, emits temperature-dependent fluorescence. FMI offers the ability to create thermal maps of integrated circuits with a thermal resolution theoretically limited to 1 m{degrees}C and a spatial resolution which is diffraction-limited to 0.3 {mu}m. Even though the fluorescent microthermal imaging (FMI) technique has been around for more than a decade, many factors that can significantly affect the thermal image quality have not been systematically studied and characterized. After a brief review of FMI theory, we will present our recent results demonstrating for the first time three important factors that have a dramatic impact on the thermal quality and sensitivity of FMI. First, the limitations imparted by photon shot noise and improvement in the signal-to-noise ratio realized through signal averaging will be discussed. Second, ultraviolet bleaching, an unavoidable problem with FMI as it currently is performed, will be characterized to identify ways to minimize its effect. Finally, the impact of film dilution on thermal sensitivity will be discussed.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 102393
- Report Number(s):
- SAND-95-1945C; CONF-9508139-2; ON: DE95017569; TRN: 95:006799
- Resource Relation:
- Conference: 50. meeting of the international Statistical Institute, Beijing (China), 21-29 Aug 1995; Other Information: PBD: 1995
- Country of Publication:
- United States
- Language:
- English
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