Characterization of a texture gradient in tantalum plate
Clark et al. have shown that significant texture gradients can be produced in rolled tantalum plate and that the strength of the gradient is dependent on the processing path. Texture gradients are often ignored because they are time consuming to characterize and add significant complexity to materials modeling. The variation in texture through the thickness of rolled materials is most commonly measured by sectioning samples to different depths through the thickness of the plate and then measuring the texture from these section planes by X-ray diffraction. A new technique based on automatic indexing of electron backscatter diffraction patterns in the scanning electron microscope enables spatially specific orientations to be measured in a practical manner. This technique allows spatial variations in texture to be measured directly enabling gradients in texture to be investigated in more detail than previously possible. This data can be used directly in coupled finite-element/polycrystal-plasticity models to simulate the effects of variations in texture on the plastic behavior of polycrystals. This work examines the variation in texture through the thickness of a tantalum plate and its resultant effect on the compressive deformation of samples prepared from the plate. The characterization of the texture gradient using the automatic point-by-point measurement technique mentioned above is described in detail. The effect of the gradient on the plastic response of through-thickness compression tests is also discussed.
- Research Organization:
- Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
- Sponsoring Organization:
- Department of Defense, Washington, DC (United States)
- DOE Contract Number:
- W-7405-ENG-36
- OSTI ID:
- 10193846
- Report Number(s):
- LA-UR-94-3413; CONF-9410244-1; ON: DE95002704; TRN: AHC29430%%63
- Resource Relation:
- Conference: 3. international symposium on structural and functional gradient materials,Lausanne (Switzerland),10-12 Oct 1994; Other Information: PBD: [1994]
- Country of Publication:
- United States
- Language:
- English
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