Atom probe field ion microscopy and related topics: A bibliography 1993

Technical Report · Sat Oct 01 00:00:00 EDT 1994

DOI:https://doi.org/10.2172/10193151· OSTI ID:10193151

Godfrey, R. D.; Miller, M. K.; Russell, K. F.

This bibliography, covering the period 1993, includes references related to the following topics: atom probe field ion microscopy (APFIM), field emission (FE), and field ion microscopy (FIM). Technique-oriented studies and applications are included. The references contained in this document were compiled from a variety of sources including computer searches and personal lists of publications. To reduce the length of this document, the references have been reduced to the minimum necessary to locate the articles. The references are listed alphabetically by authors, an Addendum of references missed in previous bibliographies is included.

• Research Organization: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: AC05-84OR21400
• OSTI ID: 10193151
• Report Number(s): ORNL/TM-12826; ON: DE95002489; TRN: 94:022869
• Resource Relation: Other Information: PBD: Oct 1994
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
ION MICROSCOPY
BIBLIOGRAPHIES
FIELD EMISSION
420500
MATERIALS TESTING