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Title: Method and apparatus for measuring enrichment of UF6

Patent ·
OSTI ID:1019111

A system and method are disclosed for determining the enrichment of .sup.235U in Uranium Hexafluoride (UF6) utilizing synthesized X-rays which are directed at a container test zone containing a sample of UF6. A detector placed behind the container test zone then detects and counts the X-rays which pass through the container and the UF6. In order to determine the portion of the attenuation due to the UF6 gas alone, this count rate may then be compared to a calibration count rate of X-rays passing through a calibration test zone which contains a vacuum, the test zone having experienced substantially similar environmental conditions as the actual test zone. Alternatively, X-rays of two differing energy levels may be alternately directed at the container, where either the container or the UF6 has a high sensitivity to the difference in the energy levels, and the other having a low sensitivity.

Research Organization:
Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC52-06NA25396
Assignee:
Los Alamos National Security, LLC (Los Alamos, NM)
Patent Number(s):
7,957,504
Application Number:
US Patent Application 12/582,641
OSTI ID:
1019111
Country of Publication:
United States
Language:
English

References (2)

Effect of Temperature on Counting Measurements in a Uranium Enrichment Monitor Based on a NaI(Tl) Spectrometer and Transmission Source conference October 2006
A Gas-Phase UF 6 Enrichment Monitor journal November 1982