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Title: LLNL/Lion Precision LVDT amplifier

Conference ·
OSTI ID:10189724

A high-precision, low-noise, LVDT amplifier has been developed which is a significant advancement on the current state of the art in contact displacement measurement. This amplifier offers the dynamic range of a typical LVDT probe but with a resolution that rivals that of non contact displacement measuring systems such as capacitance gauges and laser interferometers. Resolution of 0.1 {mu} in with 100 Hz bandwidth is possible. This level of resolution is over an order of magnitude greater than what is now commercially available. A front panel switch can reduce the bandwidth to 2.5 Hz and attain a resolution of 0.025 {mu} in. This level of resolution meets or exceeds that of displacement measuring laser interferometry or capacitance gauge systems. Contact displacement measurement offers high part spatial resolution and therefore can measure not only part contour but surface finish. Capacitance gauges and displacement laser interferometry offer poor part spatial resolution and can not provide good surface finish measurements. Machine tool builders, meteorologists and quality inspection departments can immediately utilize the higher accuracy and capabilities that this amplifier offers. The precision manufacturing industry can improve as a result of improved capability to measure parts that help reduce costs and minimize material waste.

Research Organization:
Lawrence Livermore National Lab., CA (United States)
Sponsoring Organization:
USDOE, Washington, DC (United States)
DOE Contract Number:
W-7405-ENG-48
OSTI ID:
10189724
Report Number(s):
UCRL-JC-116930; CONF-9404131-3; ON: DE95001504; CRN: C/LLNL--T-087-91-1; TRN: AHC29426%%59
Resource Relation:
Conference: American Society for Precision Engineering (ASPE) conference,Tucson, AZ (United States),6-8 Apr 1994; Other Information: PBD: Apr 1994
Country of Publication:
United States
Language:
English