A criterion for the dynamical to kinematical transition of x-ray diffraction on a bent crystal
It is well known that the peak reflectivity of a bent crystal, generally speaking, is smaller than that of a plane crystal, and it goes to zero when the crystal curvature goes to infinity. The reason for this is the transition between dynamical and kinematical diffraction that takes place as the crystal curvature increases. The physical explanation is as follows: the deviation from exact Bragg position along the beam changes so fast that the thickness over which the beam is within a Darwin width becomes too small to reflect the beam. Bent crystals are widely used as focusing elements in X-ray optics, and estimation of whether or not a bent crystal is still perfect enough to provide good reflectivity is of great importance. Currently the Advanced Photon Source (APS) is considering a number of bent crystals as focusing elements for future APS beamlines, including a sagittaly focusing monochromator and bent backscattering analyzer for inelastic X-ray scattering experiments. A criterion is given in answer to the question: To what extent is it possible to bend a crystal without loss of X-ray peak reflectivity? An expression based on the work of Chukhovskii, Gabrielyan and Petrashen, is formulated that applies to anisotropic cubic crystal and that can be used not only for conventional asymmetric Bragg diffraction, but also for inclined crystal diffraction. The following special cases are treated as examples: isotropic crystal, standard symmetrical Bragg diffraction, extremely asymmetric diffraction, and backscattering with Bragg angles near 90{degree}. In addition, an asymptotic behavior for high energies is detailed.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- W-31109-ENG-38
- OSTI ID:
- 10188471
- Report Number(s):
- ANL/XFD/CP-80084; CONF-930824-12; ON: DE94001297; TRN: 93:025510
- Resource Relation:
- Conference: Synchrotron radiation instrumentation,Gaithersburg, MD (United States),23-26 Aug 1993; Other Information: PBD: Sep 1993
- Country of Publication:
- United States
- Language:
- English
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