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Title: Measuring emittance using beam position monitors

Abstract

The Los Alamos Advanced Free Electron Laser uses a high charge (greater than InC), low emittance (normalized rams emittance less than 5{pi} mm mrad) photoinjector driven accelerator. The high brightness achieved is due, in large part, to the rapid acceleration of the electrons to relativistic velocities. As a result, the beam does not have time to thermalize its distribution and its universe profile is, in general, non-Gaussian. This, coupled with the very high brightness, makes it difficult to measure the transverse emittance. Techniques used must be able to withstand the rigors of very intense electron beams, and not be reliant on Gaussian assumptions. Beam position monitors are ideal for this. They are not susceptible to beam damage, and it has been shown previously that they can be used to measure the transverse emittance of a beam with a Gaussian profile. However, this Gaussian restriction is not necessary and, in fact, a transverse emittance measurement using beam position monitors is independent of the beam`s distribution.

Authors:
;
Publication Date:
Research Org.:
Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
Sponsoring Org.:
USDOE, Washington, DC (United States)
OSTI Identifier:
10158631
Report Number(s):
LA-UR-93-1880; CONF-930511-48
ON: DE93014470
DOE Contract Number:  
W-7405-ENG-36
Resource Type:
Conference
Resource Relation:
Conference: PAC `93: international particle accelerator conference,Washington, DC (United States),17-20 May 1993; Other Information: PBD: [1993]
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; 42 ENGINEERING; FREE ELECTRON LASERS; ELECTRON BEAMS; BEAM EMITTANCE; BEAM MONITORS; BEAM POSITION; MONITORING; 430302; 426002; INJECTION AND EXTRACTION SYSTEMS; LASERS AND MASERS

Citation Formats

Russell, S, and Carlsten, B. Measuring emittance using beam position monitors. United States: N. p., 1993. Web. doi:10.1109/PAC.1993.309381.
Russell, S, & Carlsten, B. Measuring emittance using beam position monitors. United States. https://doi.org/10.1109/PAC.1993.309381
Russell, S, and Carlsten, B. 1993. "Measuring emittance using beam position monitors". United States. https://doi.org/10.1109/PAC.1993.309381. https://www.osti.gov/servlets/purl/10158631.
@article{osti_10158631,
title = {Measuring emittance using beam position monitors},
author = {Russell, S and Carlsten, B},
abstractNote = {The Los Alamos Advanced Free Electron Laser uses a high charge (greater than InC), low emittance (normalized rams emittance less than 5{pi} mm mrad) photoinjector driven accelerator. The high brightness achieved is due, in large part, to the rapid acceleration of the electrons to relativistic velocities. As a result, the beam does not have time to thermalize its distribution and its universe profile is, in general, non-Gaussian. This, coupled with the very high brightness, makes it difficult to measure the transverse emittance. Techniques used must be able to withstand the rigors of very intense electron beams, and not be reliant on Gaussian assumptions. Beam position monitors are ideal for this. They are not susceptible to beam damage, and it has been shown previously that they can be used to measure the transverse emittance of a beam with a Gaussian profile. However, this Gaussian restriction is not necessary and, in fact, a transverse emittance measurement using beam position monitors is independent of the beam`s distribution.},
doi = {10.1109/PAC.1993.309381},
url = {https://www.osti.gov/biblio/10158631}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Jun 01 00:00:00 EDT 1993},
month = {Tue Jun 01 00:00:00 EDT 1993}
}

Conference:
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