Cross-ontological analytics for alignment of different classification schemes

Patent · Tue Sep 28 00:00:00 EDT 2010

OSTI ID:1014553

Posse, Christian ^[1]; Sanfilippo, Antonio P ^[2]; Gopalan, Banu ^[3]; Riensche, Roderick M ^[2]; Baddeley, Robert L ^[2]

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1. Seattle, WA
2. Richland, WA
3. Cleveland, OH

Quantification of the similarity between nodes in multiple electronic classification schemes is provided by automatically identifying relationships and similarities between nodes within and across the electronic classification schemes. Quantifying the similarity between a first node in a first electronic classification scheme and a second node in a second electronic classification scheme involves finding a third node in the first electronic classification scheme, wherein a first product value of an inter-scheme similarity value between the second and third nodes and an intra-scheme similarity value between the first and third nodes is a maximum. A fourth node in the second electronic classification scheme can be found, wherein a second product value of an inter-scheme similarity value between the first and fourth nodes and an intra-scheme similarity value between the second and fourth nodes is a maximum. The maximum between the first and second product values represents a measure of similarity between the first and second nodes.

• Research Organization: Posse, Christian (Seattle, WA); Sanfilippo, Antonio P (Richland, WA); Gopalan, Banu (Cleveland, OH); Riensche, Roderick M (Richland, WA); Baddeley, Robert L (Richland, WA)
• Sponsoring Organization: USDOE
• DOE Contract Number: AC05-76RLO1830
• Assignee: Posse, Christian (Seattle, WA); Sanfilippo, Antonio P (Richland, WA); Gopalan, Banu (Cleveland, OH); Riensche, Roderick M (Richland, WA); Baddeley, Robert L (Richland, WA)
• Patent Number(s): 7,805,010
• Application Number: US Patent Application 11/493,503
• OSTI ID: 1014553
• Country of Publication: United States
• Language: English