Polarized light scattering as a probe for changes in chromosome structure
- Univ. of California, Berkeley, CA (United States)
Measurements and calculations of polarized light scattering are applied to chromosomes. Calculations of the Mueller matrix, which completely describes how the polarization state of light is altered upon scattering, are developed for helical structures related to that of chromosomes. Measurements of the Mueller matrix are presented for octopus sperm heads, and dinoflagellates. Comparisons of theory and experiment are made. A working theory of polarized light scattering from helices is developed. The use of the first Born approximation vs the coupled dipole approximation are investigated. A comparison of continuous, calculated in this work, and discrete models is also discussed. By comparing light scattering measurements with theoretical predictions the average orientation of DNA in an octopus sperm head is determined. Calculations are made for the Mueller matrix of DNA plectonemic helices at UV, visible and X-ray wavelengths. Finally evidence is presented that the chromosomes of dinoflagellates are responsible for observed differential scattering of circularly-polarized light. This differential scattering is found to vary in a manner that is possibly correlated to the cell cycle of the dinoflagellates. It is concluded that by properly choosing the wavelength probe polarized light scattering can provide a useful tool to study chromosome structure.
- Research Organization:
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 10107208
- Report Number(s):
- LBL-34800; ON: DE94003953
- Resource Relation:
- Other Information: TH: Thesis (Ph.D.); PBD: Oct 1993
- Country of Publication:
- United States
- Language:
- English
Similar Records
Determination of the average orientation of DNA in the octopus sperm [ital Eledone] [ital cirrhossa] through polarized light scattering
Circular intensity differential scattering (CIDS) measurements in the soft x-ray region of the spectrum (@16 eV to 500 eV)