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  1. Global Analysis Peak Fitting for Imaging NEXAFS Data.

    Abstract not provided.
  2. Chemical Quantification of Atomic-scale EDS Maps.

    Abstract not provided.
  3. Imaging NEXAFS of Artificially Aged Elastomers: Multivariate and Chemical Analysis.

    Abstract not provided.
  4. NEXAFS imaging of the Oxidation of Filled Elastomers and Epoxies.

    Abstract not provided.
  5. PARAFAC Analysis of Nylon 6.6 GC-MS data.

    Abstract not provided.
  6. Measuring the Oxidation of Artificially Aged Elastomers with Multivariate Analysis and Imaging NEXAFS.

    Abstract not provided.
  7. Materials assurance through orthogonal materials measurements.

    Abstract not provided.
  8. Chemical Quantification of Atomic-scale EDS maps.

    Abstract not provided.
...

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"Van Benthem, Mark Hilary"

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