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Title: Applications of synchrotron x-ray fluorescence to extraterrestrial materials

Conference ·
OSTI ID:7121430

Synchrotron x-ray fluorescence (SXRF) is a valuable technique for trace element analyses of extraterrestrial materials permitting minimum detection limits less than 1 ppM for 20 micrometer spots. SXRF measurements have been performed on iron meteorites and micrometeorites using white synchrotron radiation and an energy dispersive x-ray detector at the National Synchrotron Light Source (X-26C), Brookhaven National Laboratory (NY). Partitioning of Cu between troilite (FeS) and metal in the nine iron meteorites studied suggests sub-solidus re-equilibration in these objects. A technique has been developed for determining self-absorption corrections for filtered, continuum excitation of small specimens, such as stratospheric particles and refractory inclusions in meteorites.

Research Organization:
Brookhaven National Lab., Upton, NY (USA); Chicago Univ., IL (USA). Dept. of Geophysical Sciences
DOE Contract Number:
AC02-76CH00016
OSTI ID:
7121430
Report Number(s):
BNL-39109; CONF-861114-45; ON: DE87005243
Resource Relation:
Conference: 9. international conference on application of accelerators in research and industry, Denton, TX, USA, 10 Nov 1986; Other Information: Portions of this document are illegible in microfiche products
Country of Publication:
United States
Language:
English