Reliable High-Performance Gate Oxides for Wide Band Gap Devices.

Conference · Tue Sep 01 00:00:00 EDT 2015

OSTI ID:1325523

Ihlefeld, Jon; Atcitty, Stanley

Abstract not provided.

• Research Organization: Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE Office of Electricity (OE)
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 1325523
• Report Number(s): SAND2015-7789C; 603675
• Resource Relation: Conference: Proposed for presentation at the 2016 DOE OE ESS Peer Review held September 22-24, 2015 in Portland, OR.
• Country of Publication: United States
• Language: English