Quantitatively Modeling Application Resiliency with the Data Vulnerability Factor

Conference · Wed Jan 01 00:00:00 EST 2014

OSTI ID:1286725

Yu, Li ^[1]; Li, Dong ^[2]; Mittal, Sparsh ^[2]; Vetter, Jeffrey S ^[2]

---

1. Illinois Institute of Technology
2. ORNL

• Research Organization: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
• Sponsoring Organization: USDOE Office of Science (SC)
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 1286725
• Resource Relation: Conference: ACM/IEEE International Conference for High Performance Computing, Networking, Storage, and Analysis, New Oreland, LA, USA, 20141116, 20141121
• Country of Publication: United States
• Language: English