Contribution of dielectric screening to the total capacitance of few-layer graphene electrodes

Zhan, Cheng; Jiang, De-en

doi:10.1021/acs.jpclett.6b00047

Title: Contribution of dielectric screening to the total capacitance of few-layer graphene electrodes

Journal Article · Wed Feb 17 00:00:00 EST 2016 · Journal of Physical Chemistry Letters

DOI:https://doi.org/10.1021/acs.jpclett.6b00047· OSTI ID:1267032

Zhan, Cheng ^[1]; Jiang, De-en ^[1]

Univ. of California, Riverside, CA (United States)

We apply joint density functional theory (JDFT), which treats the electrode/electrolyte interface self-consistently, to an electric double-layer capacitor (EDLC) based on few-layer graphene electrodes. The JDFT approach allows us to quantify a third contribution to the total capacitance beyond quantum capacitance (C_Q) and EDL capacitance (C_EDL). This contribution arises from the dielectric screening of the electric field by the surface of the few-layer graphene electrode, and we therefore term it the dielectric capacitance (C_Dielec). We find that C_Dielec becomes significant in affecting the total capacitance when the number of graphene layers in the electrode is more than three. In conclusion, our investigation sheds new light on the significance of the electrode dielectric screening on the capacitance of few-layer graphene electrodes.

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Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States); Energy Frontier Research Centers (EFRC) (United States). Fluid Interface Reactions, Structures and Transport Center (FIRST)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1267032

Journal Information:: Journal of Physical Chemistry Letters, Vol. 7, Issue 5; ISSN 1948-7185

Publisher:: American Chemical SocietyCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 36 works

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