Impact of Interface Defects on Tunneling FET Turn-on Steepness.
Conference
·
OSTI ID:1262936
Abstract not provided.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- National Science Foundation (NSF)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 1262936
- Report Number(s):
- SAND2015-5522C; 594852
- Resource Relation:
- Conference: Proposed for presentation at the Berkeley Symposium on Energy Efficient Electronics held October 1-2, 2015 in Berkeley, CA.
- Country of Publication:
- United States
- Language:
- English
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