skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Determining the Location and Size of Conductive Filaments in TaOx Memristive Devices Using Focused Ion Beam Irradiation.

Abstract

Abstract not provided.

Authors:
; ; ; ; ; ; ; ; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1241773
Report Number(s):
SAND2014-18442C
540199
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the The Rio Grande Symposium on Advaced Materials held October 6, 2014 in Albuquerque, NM.
Country of Publication:
United States
Language:
English

Citation Formats

Pacheco, Jose L, Pacheco, Jose L, Pacheco, Jose L, Pacheco, Jose L, Hughart, David Russell, Hughart, David Russell, Hughart, David Russell, Hughart, David Russell, Vizkelethy, Gyorgy, Vizkelethy, Gyorgy, Vizkelethy, Gyorgy, Vizkelethy, Gyorgy, Bielejec, Edward S., Bielejec, Edward S., Bielejec, Edward S., and Bielejec, Edward S. Determining the Location and Size of Conductive Filaments in TaOx Memristive Devices Using Focused Ion Beam Irradiation.. United States: N. p., 2014. Web.
Pacheco, Jose L, Pacheco, Jose L, Pacheco, Jose L, Pacheco, Jose L, Hughart, David Russell, Hughart, David Russell, Hughart, David Russell, Hughart, David Russell, Vizkelethy, Gyorgy, Vizkelethy, Gyorgy, Vizkelethy, Gyorgy, Vizkelethy, Gyorgy, Bielejec, Edward S., Bielejec, Edward S., Bielejec, Edward S., & Bielejec, Edward S. Determining the Location and Size of Conductive Filaments in TaOx Memristive Devices Using Focused Ion Beam Irradiation.. United States.
Pacheco, Jose L, Pacheco, Jose L, Pacheco, Jose L, Pacheco, Jose L, Hughart, David Russell, Hughart, David Russell, Hughart, David Russell, Hughart, David Russell, Vizkelethy, Gyorgy, Vizkelethy, Gyorgy, Vizkelethy, Gyorgy, Vizkelethy, Gyorgy, Bielejec, Edward S., Bielejec, Edward S., Bielejec, Edward S., and Bielejec, Edward S. 2014. "Determining the Location and Size of Conductive Filaments in TaOx Memristive Devices Using Focused Ion Beam Irradiation.". United States. https://www.osti.gov/servlets/purl/1241773.
@article{osti_1241773,
title = {Determining the Location and Size of Conductive Filaments in TaOx Memristive Devices Using Focused Ion Beam Irradiation.},
author = {Pacheco, Jose L and Pacheco, Jose L and Pacheco, Jose L and Pacheco, Jose L and Hughart, David Russell and Hughart, David Russell and Hughart, David Russell and Hughart, David Russell and Vizkelethy, Gyorgy and Vizkelethy, Gyorgy and Vizkelethy, Gyorgy and Vizkelethy, Gyorgy and Bielejec, Edward S. and Bielejec, Edward S. and Bielejec, Edward S. and Bielejec, Edward S.},
abstractNote = {Abstract not provided.},
doi = {},
url = {https://www.osti.gov/biblio/1241773}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Wed Oct 01 00:00:00 EDT 2014},
month = {Wed Oct 01 00:00:00 EDT 2014}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

Save / Share: