Determining the Location and Size of Conductive Filaments in TaOx Memristive Devices Using Focused Ion Beam Irradiation.
Abstract
Abstract not provided.
- Authors:
- Publication Date:
- Research Org.:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA)
- OSTI Identifier:
- 1241773
- Report Number(s):
- SAND2014-18442C
540199
- DOE Contract Number:
- AC04-94AL85000
- Resource Type:
- Conference
- Resource Relation:
- Conference: Proposed for presentation at the The Rio Grande Symposium on Advaced Materials held October 6, 2014 in Albuquerque, NM.
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Pacheco, Jose L, Pacheco, Jose L, Pacheco, Jose L, Pacheco, Jose L, Hughart, David Russell, Hughart, David Russell, Hughart, David Russell, Hughart, David Russell, Vizkelethy, Gyorgy, Vizkelethy, Gyorgy, Vizkelethy, Gyorgy, Vizkelethy, Gyorgy, Bielejec, Edward S., Bielejec, Edward S., Bielejec, Edward S., and Bielejec, Edward S. Determining the Location and Size of Conductive Filaments in TaOx Memristive Devices Using Focused Ion Beam Irradiation.. United States: N. p., 2014.
Web.
Pacheco, Jose L, Pacheco, Jose L, Pacheco, Jose L, Pacheco, Jose L, Hughart, David Russell, Hughart, David Russell, Hughart, David Russell, Hughart, David Russell, Vizkelethy, Gyorgy, Vizkelethy, Gyorgy, Vizkelethy, Gyorgy, Vizkelethy, Gyorgy, Bielejec, Edward S., Bielejec, Edward S., Bielejec, Edward S., & Bielejec, Edward S. Determining the Location and Size of Conductive Filaments in TaOx Memristive Devices Using Focused Ion Beam Irradiation.. United States.
Pacheco, Jose L, Pacheco, Jose L, Pacheco, Jose L, Pacheco, Jose L, Hughart, David Russell, Hughart, David Russell, Hughart, David Russell, Hughart, David Russell, Vizkelethy, Gyorgy, Vizkelethy, Gyorgy, Vizkelethy, Gyorgy, Vizkelethy, Gyorgy, Bielejec, Edward S., Bielejec, Edward S., Bielejec, Edward S., and Bielejec, Edward S. 2014.
"Determining the Location and Size of Conductive Filaments in TaOx Memristive Devices Using Focused Ion Beam Irradiation.". United States. https://www.osti.gov/servlets/purl/1241773.
@article{osti_1241773,
title = {Determining the Location and Size of Conductive Filaments in TaOx Memristive Devices Using Focused Ion Beam Irradiation.},
author = {Pacheco, Jose L and Pacheco, Jose L and Pacheco, Jose L and Pacheco, Jose L and Hughart, David Russell and Hughart, David Russell and Hughart, David Russell and Hughart, David Russell and Vizkelethy, Gyorgy and Vizkelethy, Gyorgy and Vizkelethy, Gyorgy and Vizkelethy, Gyorgy and Bielejec, Edward S. and Bielejec, Edward S. and Bielejec, Edward S. and Bielejec, Edward S.},
abstractNote = {Abstract not provided.},
doi = {},
url = {https://www.osti.gov/biblio/1241773},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Wed Oct 01 00:00:00 EDT 2014},
month = {Wed Oct 01 00:00:00 EDT 2014}
}
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