Hyper-accuracy and Error-Scaling in Gate Set Tomography.

Conference · Sun Feb 01 00:00:00 EST 2015

OSTI ID:1239955

Rudinger, Kenneth Michael; Blume-Kohout, Robin J; Nielsen, Erik; Mizrahi, Jonathan A.; Clark, Craig Robert; Sterk, Jonathan David; Maunz, Peter Lukas Wilhelm

Abstract not provided.

• Research Organization: Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: ARO
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 1239955
• Report Number(s): SAND2015-1221C; 567128
• Resource Relation: Conference: Proposed for presentation at the American Physical Society March Meeting held March 2 - February 20, 2015 in San Antonio, TX.
• Country of Publication: United States
• Language: English