Effects of Device Scaling on Angular Single-Event Effects.
Abstract
Abstract not provided.
- Authors:
- Publication Date:
- Research Org.:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA)
- OSTI Identifier:
- 1239367
- Report Number(s):
- SAND2016-0886C
619003
- DOE Contract Number:
- AC04-94AL85000
- Resource Type:
- Conference
- Resource Relation:
- Conference: Proposed for presentation at the Microelectronics Reliability & Qualification Working Meeting held February 9-10, 2016 in El Segundo, CA.
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Lee, David S., and Draper, Jeffrey. Effects of Device Scaling on Angular Single-Event Effects.. United States: N. p., 2016.
Web.
Lee, David S., & Draper, Jeffrey. Effects of Device Scaling on Angular Single-Event Effects.. United States.
Lee, David S., and Draper, Jeffrey. 2016.
"Effects of Device Scaling on Angular Single-Event Effects.". United States. https://www.osti.gov/servlets/purl/1239367.
@article{osti_1239367,
title = {Effects of Device Scaling on Angular Single-Event Effects.},
author = {Lee, David S. and Draper, Jeffrey},
abstractNote = {Abstract not provided.},
doi = {},
url = {https://www.osti.gov/biblio/1239367},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Mon Feb 01 00:00:00 EST 2016},
month = {Mon Feb 01 00:00:00 EST 2016}
}
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