Method of measuring luminescence of a material
Patent
·
OSTI ID:1229734
A method of measuring luminescence of a material is disclosed. The method includes applying a light source to excite an exposed material. The method also includes amplifying an emission signal of the material. The method further includes measuring a luminescent emission at a fixed time window of about 10 picoseconds to about 10 nanoseconds. The luminescence may be radio photoluminescence (RPL) or optically stimulated luminescence (OSL).
- Research Organization:
- Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC05-76RL01830
- Assignee:
- BATTELLE MEMORIAL INSTITUTE
- Patent Number(s):
- 9,213,106
- Application Number:
- 13/449,607
- OSTI ID:
- 1229734
- Resource Relation:
- Patent File Date: 2012 Apr 08
- Country of Publication:
- United States
- Language:
- English
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