Systems and methods for sample analysis

Cooks, Robert Graham; Li, Guangtao; Li, Xin; Ouyang, Zheng

Title: Systems and methods for sample analysis

Patent · Tue Oct 20 00:00:00 EDT 2015

OSTI ID:1223693

Cooks, Robert Graham; Li, Guangtao; Li, Xin; Ouyang, Zheng

The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides a system for analyzing a sample that includes a probe including a material connected to a high voltage source, a device for generating a heated gas, and a mass analyzer.

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Research Organization:: Purdue Univ., West Lafayette, IN (United States)

Sponsoring Organization:: USDOE

DOE Contract Number:: FG02-06ER15807

Assignee:: Purdue Research Foundation (West Lafayette, IN)

Patent Number(s):: 9,165,752

Application Number:: 14/566,838

OSTI ID:: 1223693

Resource Relation:: Patent File Date: 2014 Dec 11

Country of Publication:: United States

Language:: English

References (40)

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