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Title: Electrostatic Coupling between Two Surfaces of a Topological Insulator Nanodevice

Journal Article · · Physical Review Letters
 [1];  [1];  [2];  [1];  [1];  [3];  [4];  [4];  [1];  [1];  [1]
  1. Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
  2. Hebrew Univ. of Jerusalem (Israel). Racah Inst. of Physics; Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
  3. National Inst. of Standards and Technology (NIST), Gaithersburg, MD (United States). Center for Neutron Research; Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Univ. of Maryland, College Park, MD (United States). Dept. of Physics, Center for Nanophysics and Advanced Materials
  4. National Inst. for Materials Science (NIMS), Tsukuba (Japan). Advanced Materials Lab.

We report on electronic transport measurements of dual-gated nanodevices of the low-carrier density topological insulator (TI) Bi1.5Sb0.5Te1.7Se1.3. In all devices, the upper and lower surface states are independently tunable to the Dirac point by the top and bottom gate electrodes. In thin devices, electric fields are found to penetrate through the bulk, indicating finite capacitive coupling between the surface states. A charging model allows us to use the penetrating electric field as a measurement of the intersurface capacitance CTI and the surface state energy-density relationship $μ(n)$, which is found to be consistent with independent angle-resolved photoemission spectroscopy measurements. At high magnetic fields, increased field penetration through the surface states is observed, strongly suggestive of the opening of a surface state band gap due to broken time-reversal symmetry.

Research Organization:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
Sponsoring Organization:
USDOE
Grant/Contract Number:
AC52-07NA27344; SC0006418
OSTI ID:
1184091
Alternate ID(s):
OSTI ID: 1181193
Report Number(s):
LLNL-JRNL-653845; PRLTAO
Journal Information:
Physical Review Letters, Vol. 113, Issue 20; ISSN 0031-9007
Publisher:
American Physical Society (APS)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 30 works
Citation information provided by
Web of Science

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Cited By (11)

Quantum transport of two-species Dirac fermions in dual-gated three-dimensional topological insulators journal May 2016
In-plane topological p-n junction in the three-dimensional topological insulator Bi2−xSbxTe3−ySey journal December 2016
Realization of a vertical topological p–n junction in epitaxial Sb2Te3/Bi2Te3 heterostructures journal November 2015
In situ disentangling surface state transport channels of a topological insulator thin film by gating journal September 2018
Enhancement of field electron emission in topological insulator Bi 2 Se 3 by Ni doping journal January 2018
Topological insulator n–p–n junctions in a magnetic field journal January 2019
rf Quantum Capacitance of the Topological Insulator Bi 2 Se 3 in the Bulk Depleted Regime for Field-Effect Transistors journal February 2018
Tunable Coupling between Surface States of a Three-Dimensional Topological Insulator in the Quantum Hall Regime journal July 2019
Realization of a vertical topological p–n junction in epitaxial Sb2Te3/Bi2Te3 heterostructures text January 2015
Quantum transport of two-species Dirac fermions in dual-gated three-dimensional topological insulators text January 2015
In-plane Topological p-n Junction in the Three-Dimensional Topological Insulator Bi$_{2-x}$Sb$_x$Te$_{3-y}$Se$_y$ text January 2016