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Title: Technical Comparative Analysis of "Best of Breed" Turnkey Si-Based Processes and Equipment, to be Used to Produce a Combined Multi-entity Research and Development Technology Roadmap for Thick and Thin Silicon PV

Abstract

A side-by-side analysis was done on then currently available technology, along with roadmaps to push each particular option forward. Variations in turnkey line processes can and do result in finished solar device performance. Together with variations in starting material quality, the result is a distribution of efficiencies. Forensic analysis and characterization of each crystalline Si based technology will determine the most promising approach with respect to cost, efficiency and reliability. Forensic analysis will also shed light on the causes of binning variations. Si solar cells were forensically analyzed from each turn key supplier using a host of techniques

Authors:
 [1];  [1]
  1. The Solar Energy Consortium, Kingston, NY (United States)
Publication Date:
Research Org.:
The Solar Energy Consortium, Kingston, NY (United States)
Sponsoring Org.:
USDOE
Contributing Org.:
IBM, Hawthorne, NY (United States)
OSTI Identifier:
1176920
Report Number(s):
Final Report-DOE 282 TSEC
DOE Contract Number:  
EE0000282
Resource Type:
Technical Report
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; Silicon; Turn key lines

Citation Formats

Hovel, Harold, and Prettyman, Kevin. Technical Comparative Analysis of "Best of Breed" Turnkey Si-Based Processes and Equipment, to be Used to Produce a Combined Multi-entity Research and Development Technology Roadmap for Thick and Thin Silicon PV. United States: N. p., 2015. Web. doi:10.2172/1176920.
Hovel, Harold, & Prettyman, Kevin. Technical Comparative Analysis of "Best of Breed" Turnkey Si-Based Processes and Equipment, to be Used to Produce a Combined Multi-entity Research and Development Technology Roadmap for Thick and Thin Silicon PV. United States. https://doi.org/10.2172/1176920
Hovel, Harold, and Prettyman, Kevin. 2015. "Technical Comparative Analysis of "Best of Breed" Turnkey Si-Based Processes and Equipment, to be Used to Produce a Combined Multi-entity Research and Development Technology Roadmap for Thick and Thin Silicon PV". United States. https://doi.org/10.2172/1176920. https://www.osti.gov/servlets/purl/1176920.
@article{osti_1176920,
title = {Technical Comparative Analysis of "Best of Breed" Turnkey Si-Based Processes and Equipment, to be Used to Produce a Combined Multi-entity Research and Development Technology Roadmap for Thick and Thin Silicon PV},
author = {Hovel, Harold and Prettyman, Kevin},
abstractNote = {A side-by-side analysis was done on then currently available technology, along with roadmaps to push each particular option forward. Variations in turnkey line processes can and do result in finished solar device performance. Together with variations in starting material quality, the result is a distribution of efficiencies. Forensic analysis and characterization of each crystalline Si based technology will determine the most promising approach with respect to cost, efficiency and reliability. Forensic analysis will also shed light on the causes of binning variations. Si solar cells were forensically analyzed from each turn key supplier using a host of techniques},
doi = {10.2172/1176920},
url = {https://www.osti.gov/biblio/1176920}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Fri Mar 27 00:00:00 EDT 2015},
month = {Fri Mar 27 00:00:00 EDT 2015}
}