Technical Comparative Analysis of "Best of Breed" Turnkey Si-Based Processes and Equipment, to be Used to Produce a Combined Multi-entity Research and Development Technology Roadmap for Thick and Thin Silicon PV
Abstract
A side-by-side analysis was done on then currently available technology, along with roadmaps to push each particular option forward. Variations in turnkey line processes can and do result in finished solar device performance. Together with variations in starting material quality, the result is a distribution of efficiencies. Forensic analysis and characterization of each crystalline Si based technology will determine the most promising approach with respect to cost, efficiency and reliability. Forensic analysis will also shed light on the causes of binning variations. Si solar cells were forensically analyzed from each turn key supplier using a host of techniques
- Authors:
-
- The Solar Energy Consortium, Kingston, NY (United States)
- Publication Date:
- Research Org.:
- The Solar Energy Consortium, Kingston, NY (United States)
- Sponsoring Org.:
- USDOE
- Contributing Org.:
- IBM, Hawthorne, NY (United States)
- OSTI Identifier:
- 1176920
- Report Number(s):
- Final Report-DOE 282 TSEC
- DOE Contract Number:
- EE0000282
- Resource Type:
- Technical Report
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 14 SOLAR ENERGY; Silicon; Turn key lines
Citation Formats
Hovel, Harold, and Prettyman, Kevin. Technical Comparative Analysis of "Best of Breed" Turnkey Si-Based Processes and Equipment, to be Used to Produce a Combined Multi-entity Research and Development Technology Roadmap for Thick and Thin Silicon PV. United States: N. p., 2015.
Web. doi:10.2172/1176920.
Hovel, Harold, & Prettyman, Kevin. Technical Comparative Analysis of "Best of Breed" Turnkey Si-Based Processes and Equipment, to be Used to Produce a Combined Multi-entity Research and Development Technology Roadmap for Thick and Thin Silicon PV. United States. https://doi.org/10.2172/1176920
Hovel, Harold, and Prettyman, Kevin. 2015.
"Technical Comparative Analysis of "Best of Breed" Turnkey Si-Based Processes and Equipment, to be Used to Produce a Combined Multi-entity Research and Development Technology Roadmap for Thick and Thin Silicon PV". United States. https://doi.org/10.2172/1176920. https://www.osti.gov/servlets/purl/1176920.
@article{osti_1176920,
title = {Technical Comparative Analysis of "Best of Breed" Turnkey Si-Based Processes and Equipment, to be Used to Produce a Combined Multi-entity Research and Development Technology Roadmap for Thick and Thin Silicon PV},
author = {Hovel, Harold and Prettyman, Kevin},
abstractNote = {A side-by-side analysis was done on then currently available technology, along with roadmaps to push each particular option forward. Variations in turnkey line processes can and do result in finished solar device performance. Together with variations in starting material quality, the result is a distribution of efficiencies. Forensic analysis and characterization of each crystalline Si based technology will determine the most promising approach with respect to cost, efficiency and reliability. Forensic analysis will also shed light on the causes of binning variations. Si solar cells were forensically analyzed from each turn key supplier using a host of techniques},
doi = {10.2172/1176920},
url = {https://www.osti.gov/biblio/1176920},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Fri Mar 27 00:00:00 EDT 2015},
month = {Fri Mar 27 00:00:00 EDT 2015}
}
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