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Title: Ion chamber based neutron detectors

Patent ·
OSTI ID:1165430

A neutron detector with monolithically integrated readout circuitry, including: a bonded semiconductor die; an ion chamber formed in the bonded semiconductor die; a first electrode and a second electrode formed in the ion chamber; a neutron absorbing material filling the ion chamber; and the readout circuitry which is electrically coupled to the first and second electrodes. The bonded semiconductor die includes an etched semiconductor substrate bonded to an active semiconductor substrate. The readout circuitry is formed in a portion of the active semiconductor substrate. The ion chamber has a substantially planar first surface on which the first electrode is formed and a substantially planar second surface, parallel to the first surface, on which the second electrode is formed. The distance between the first electrode and the second electrode may be equal to or less than the 50% attenuation length for neutrons in the neutron absorbing material filling the ion chamber.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC04-94AL85000
Assignee:
Sandia Corporation (Albuquerque, NM)
Patent Number(s):
8,912,502
Application Number:
13/559,370
OSTI ID:
1165430
Resource Relation:
Patent File Date: 2012 Jul 26
Country of Publication:
United States
Language:
English

References (5)

Radiation-detection/scintillator composite and method of manufacture patent January 1989
Gamma resistant dual range neutron detector patent-application November 2003
Method and apparatus for detecting high-energy radiation using a pulse mode ion chamber patent-application October 2005
Micro neutron detectors patent-application January 2007
Simulation of high-pressure micro-capillary 3He counters journal September 2008