Spatially resolved imaging of opto-electrical property variations
Patent
·
OSTI ID:1159516
Systems and methods for opto electric properties are provided. A light source illuminates a sample. A reference detector senses light from the light source. A sample detector receives light from the sample. A positioning fixture allows for relative positioning of the sample or the light source with respect to each other. An electrical signal device measures the electrical properties of the sample. The reference detector, sample detector and electrical signal device provide information that may be processed to determine opto-electric properties of the same.
- Research Organization:
- Argonne National Laboratory (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC02-06CH11357
- Assignee:
- Uchicago Argonne, LLC (Chicago, IL)
- Patent Number(s):
- 8,836,944
- Application Number:
- 13/629,320
- OSTI ID:
- 1159516
- Country of Publication:
- United States
- Language:
- English
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