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Title: Spatially resolved imaging of opto-electrical property variations

Patent ·
OSTI ID:1159516

Systems and methods for opto electric properties are provided. A light source illuminates a sample. A reference detector senses light from the light source. A sample detector receives light from the sample. A positioning fixture allows for relative positioning of the sample or the light source with respect to each other. An electrical signal device measures the electrical properties of the sample. The reference detector, sample detector and electrical signal device provide information that may be processed to determine opto-electric properties of the same.

Research Organization:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC02-06CH11357
Assignee:
Uchicago Argonne, LLC (Chicago, IL)
Patent Number(s):
8,836,944
Application Number:
13/629,320
OSTI ID:
1159516
Country of Publication:
United States
Language:
English

References (6)

Optical scanning tomography for three-dimensional dosimetry and imaging of energy fields patent April 2001
Light source power modulation for use with chemical and biochemical analysis patent March 2002
Fast laser scanning optical CT apparatus patent December 2009
Apparatus and method for illuminator-independent color measurements patent December 2010
Sample element qualification patent-application February 2005
Color sensor patent-application July 2007

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