Failure Mechanisms in High Voltage Mylar Capacitors.
Abstract
Abstract not provided.
- Authors:
- Publication Date:
- Research Org.:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA)
- OSTI Identifier:
- 1140285
- Report Number(s):
- SAND2014-0737C
498587
- DOE Contract Number:
- AC04-94AL85000
- Resource Type:
- Conference
- Resource Relation:
- Conference: Proposed for presentation at the (CARTS) Capacitor and Resistor Technology Symposium held March 31 - April 4, 2014 in Santa Clara, CA.
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Herzberger, Jaemi Lee, and Tanner, Danelle Mary. Failure Mechanisms in High Voltage Mylar Capacitors.. United States: N. p., 2014.
Web.
Herzberger, Jaemi Lee, & Tanner, Danelle Mary. Failure Mechanisms in High Voltage Mylar Capacitors.. United States.
Herzberger, Jaemi Lee, and Tanner, Danelle Mary. 2014.
"Failure Mechanisms in High Voltage Mylar Capacitors.". United States. https://www.osti.gov/servlets/purl/1140285.
@article{osti_1140285,
title = {Failure Mechanisms in High Voltage Mylar Capacitors.},
author = {Herzberger, Jaemi Lee and Tanner, Danelle Mary},
abstractNote = {Abstract not provided.},
doi = {},
url = {https://www.osti.gov/biblio/1140285},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Wed Jan 01 00:00:00 EST 2014},
month = {Wed Jan 01 00:00:00 EST 2014}
}
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.