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Title: Failure Mechanisms in High Voltage Mylar Capacitors.

Abstract

Abstract not provided.

Authors:
;
Publication Date:
Research Org.:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1140285
Report Number(s):
SAND2014-0737C
498587
DOE Contract Number:  
AC04-94AL85000
Resource Type:
Conference
Resource Relation:
Conference: Proposed for presentation at the (CARTS) Capacitor and Resistor Technology Symposium held March 31 - April 4, 2014 in Santa Clara, CA.
Country of Publication:
United States
Language:
English

Citation Formats

Herzberger, Jaemi Lee, and Tanner, Danelle Mary. Failure Mechanisms in High Voltage Mylar Capacitors.. United States: N. p., 2014. Web.
Herzberger, Jaemi Lee, & Tanner, Danelle Mary. Failure Mechanisms in High Voltage Mylar Capacitors.. United States.
Herzberger, Jaemi Lee, and Tanner, Danelle Mary. 2014. "Failure Mechanisms in High Voltage Mylar Capacitors.". United States. https://www.osti.gov/servlets/purl/1140285.
@article{osti_1140285,
title = {Failure Mechanisms in High Voltage Mylar Capacitors.},
author = {Herzberger, Jaemi Lee and Tanner, Danelle Mary},
abstractNote = {Abstract not provided.},
doi = {},
url = {https://www.osti.gov/biblio/1140285}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Wed Jan 01 00:00:00 EST 2014},
month = {Wed Jan 01 00:00:00 EST 2014}
}

Conference:
Other availability
Please see Document Availability for additional information on obtaining the full-text document. Library patrons may search WorldCat to identify libraries that hold this conference proceeding.

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