A bi-prism interferometer for hard x-ray photons

Isakovic, A F; Siddons, D; Stein, A; Warren, J B; Sandy, A R; Narayanan, M S; Ablett, J M

doi:10.1107/S0909049510012823

Title: A bi-prism interferometer for hard x-ray photons

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Abstract

Micro-fabricated bi-prisms have been used to create an interference pattern from an incident hard X-ray beam, and the intensity of the pattern probed with fluorescence from a 30 nm-thick metal film. Maximum fringe visibility exceeded 0.9 owing to the nano-sized probe and the choice of single-crystal prism material. A full near-field analysis is necessary to describe the fringe field intensities, and the transverse coherence lengths were extracted at APS beamline 8-ID-I. It is also shown that the maximum number of fringes is dependent only on the complex refractive index of the prism material.

Authors:: Isakovic, A F; Siddons, D; Stein, A; Warren, J B; Sandy, A R; Narayanan, M S; Ablett, J M

Publication Date:: Tue Apr 06 00:00:00 EDT 2010

Research Org.:: Brookhaven National Lab. (BNL), Upton, NY (United States)

Sponsoring Org.:: Doe - Office Of Science

OSTI Identifier:: 985826

Report Number(s):: BNL-93875-2010-JA
Journal ID: ISSN 0909-0495; JSYRES; R&D Project: LS001; KC0401030; TRN: US201016%%2274

DOE Contract Number:: DE-AC02-98CH10886

Resource Type:: Journal Article

Journal Name:: Journal of Synchrotron Radiation

Additional Journal Information:: Journal Volume: 17; Journal Issue: 4; Journal ID: ISSN 0909-0495

Country of Publication:: United States

Language:: English

Subject:: 47 OTHER INSTRUMENTATION; COHERENCE LENGTH; FLUORESCENCE; INTERFEROMETERS; PHOTONS; PRISMS; REFRACTIVE INDEX; VISIBILITY

Citation Formats


                    Isakovic, A F, Siddons, D, Stein, A, Warren, J B, Sandy, A R, Narayanan, M S, Ablett, J M, and Metzler, M. and Evans-Lutterodt, K. A bi-prism interferometer for hard x-ray photons.  United States: N. p., 2010. 
        Web.  doi:10.1107/S0909049510012823.

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                    Isakovic, A F, Siddons, D, Stein, A, Warren, J B, Sandy, A R, Narayanan, M S, Ablett, J M, & Metzler, M. and Evans-Lutterodt, K. A bi-prism interferometer for hard x-ray photons.  United States.  https://doi.org/10.1107/S0909049510012823

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                    Isakovic, A F, Siddons, D, Stein, A, Warren, J B, Sandy, A R, Narayanan, M S, Ablett, J M, and Metzler, M. and Evans-Lutterodt, K. 2010.  
        "A bi-prism interferometer for hard x-ray photons".  United States.  https://doi.org/10.1107/S0909049510012823.

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@article{osti_985826,

  title        = {A bi-prism interferometer for hard x-ray photons},

  author       = {Isakovic, A F and Siddons, D and Stein, A and Warren, J B and Sandy, A R and Narayanan, M S and Ablett, J M and Metzler, M. and Evans-Lutterodt, K.},

  abstractNote = {Micro-fabricated bi-prisms have been used to create an interference pattern from an incident hard X-ray beam, and the intensity of the pattern probed with fluorescence from a 30 nm-thick metal film. Maximum fringe visibility exceeded 0.9 owing to the nano-sized probe and the choice of single-crystal prism material. A full near-field analysis is necessary to describe the fringe field intensities, and the transverse coherence lengths were extracted at APS beamline 8-ID-I. It is also shown that the maximum number of fringes is dependent only on the complex refractive index of the prism material.},

  doi          = {10.1107/S0909049510012823},

  url          = {https://www.osti.gov/biblio/985826},
  journal      = {Journal of Synchrotron Radiation},

  issn         = {0909-0495},

  number       = 4,

  volume       = 17,

  place        = {United States},

  year         = {Tue Apr 06 00:00:00 EDT 2010},

  month        = {Tue Apr 06 00:00:00 EDT 2010}

}

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