Depth-Dependent Critical Behavior in V2H
Journal Article
·
· Physical Review. B, Condensed Matter and Materials Physics
Using x-ray diffuse scattering, we investigate the critical behavior of an order-disorder phase transition in a defective 'skin layer' of V{sub 2}H. In the skin layer, there exist walls of dislocation lines oriented normal to the surface. The density of dislocation lines within a wall decreases continuously with depth. We find that, because of this inhomogeneous distribution of defects, the transition effectively occurs at a depth-dependent local critical temperature. A depth-dependent scaling law is proposed to describe the corresponding critical ordering behavior.
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source
- Sponsoring Organization:
- Doe - Office Of Science
- DOE Contract Number:
- DE-AC02-98CH10886
- OSTI ID:
- 980133
- Report Number(s):
- BNL-93051-2010-JA; TRN: US201015%%1518
- Journal Information:
- Physical Review. B, Condensed Matter and Materials Physics, Vol. 79, Issue 18; ISSN 1098-0121
- Country of Publication:
- United States
- Language:
- English
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