Asphaltene Adsorption onto Self-Assembled Monolayers of Alkyltrichlorosilanes of Varying Chain Length

Journal Article · Thu Jan 01 00:00:00 EST 2009 · ACS Applied Materials & Interfaces

DOI:https://doi.org/10.1021/am900203u· OSTI ID:980029

Turgman-Cohen, S; Fischer, D; Kilpatrick, P; Genzer, J

The adsorption of asphaltenes onto flat silica surfaces modified with self-assembled monolayers (SAMs) of alkyltrichlorosilanes of varying thickness due to a variable number of carbon atoms (N{sub C}) has been studied by means of contact angle measurements, spectroscopic ellipsometry, and near-edge X-ray absorption fine structure spectroscopy. The extent of asphaltene adsorption was found to depend primarily on the ability of the SAM layer to shield the underlying silicon substrate from interacting with the asphaltenes present in solution. Specifically, asphaltene adsorption decreased with an increase in NC and/or an increase in SAM grafting density, {sigma}{sub SAM}, (i.e., number of SAM molecules per unit area). The effect of the solvent quality on the extent of asphaltene adsorption was gauged by adsorbing asphaltenes from toluene, 1-methylnaphthalene, tetralin, decalin, and toluene-heptanes mixtures. The extent of asphaltene adsorption was found to increase proportionally with a decrease in the Hildebrand solubility parameter of the solvent.

• Research Organization: Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source
• Sponsoring Organization: Doe - Office Of Science
• DOE Contract Number: DE-AC02-98CH10886
• OSTI ID: 980029
• Report Number(s): BNL-92947-2010-JA; TRN: US201015%%1414
• Journal Information: ACS Applied Materials & Interfaces, Vol. 1, Issue 6; ISSN 1944-8244
• Country of Publication: United States
• Language: English

Related Subjects

37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
ABSORPTION
ADSORPTION
ASPHALTENES
ATOMS
CARBON
CHAINS
DECALIN
DENSITY
ELLIPSOMETRY
FINE STRUCTURE
LAYERS
LENGTH
MIXTURES
MOLECULES
SHIELDS
SILICA
SILICON
SOLUBILITY
SOLVENTS
SPECTROSCOPY
SUBSTRATES
SURFACES
TETRALIN
THICKNESS
TOLUENE
UNITS
national synchrotron light source