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Title: Probing Alzheimers Disease Pathology and Early Detection at the NSLS with Infrared, XRF, and DEI

Abstract

We explored diffraction enhanced imaging (DEI) in both planar and computed tomography (CT) modes for early detection of beta amyloid deposition, a hallmark feature in Alzheimer's disease (AD). Since amyloid plaques precede clinical symptoms by years, their early detection is of great interest. These findings were correlated with results from synchrotron infrared microspectroscopic imaging and X-ray fluorescence microscopy, to determine the secondary structure of the amyloid beta protein and metal concentration in the amyloid plaques, respectively.

Authors:
; ; ; ; ; ; ; ;
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source
Sponsoring Org.:
Doe - Office Of Science
OSTI Identifier:
959973
Report Number(s):
BNL-82959-2009-JA
TRN: US1005855
DOE Contract Number:  
DE-AC02-98CH10886
Resource Type:
Journal Article
Journal Name:
Synchrotron Radiation News
Additional Journal Information:
Journal Volume: 21; Journal Issue: 3
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; 59 BASIC BIOLOGICAL SCIENCES; 99 GENERAL AND MISCELLANEOUS//MATHEMATICS, COMPUTING, AND INFORMATION SCIENCE; COMPUTERIZED TOMOGRAPHY; DEPOSITION; DETECTION; DIFFRACTION; DISEASES; FLUORESCENCE; MICROSCOPY; PATHOLOGY; PROTEINS; SYMPTOMS; SYNCHROTRONS; NSLS; X-RAY FLUORESCENCE ANALYSIS; national synchrotron light source

Citation Formats

Zhong, Z, Bennett, D, Chapman, D, Chen, J, Connor, D, Dilmanian, A, Faulconer, L, Kao, T, Leskovjan, A, and et al. Probing Alzheimers Disease Pathology and Early Detection at the NSLS with Infrared, XRF, and DEI. United States: N. p., 2008. Web.
Zhong, Z, Bennett, D, Chapman, D, Chen, J, Connor, D, Dilmanian, A, Faulconer, L, Kao, T, Leskovjan, A, & et al. Probing Alzheimers Disease Pathology and Early Detection at the NSLS with Infrared, XRF, and DEI. United States.
Zhong, Z, Bennett, D, Chapman, D, Chen, J, Connor, D, Dilmanian, A, Faulconer, L, Kao, T, Leskovjan, A, and et al. 2008. "Probing Alzheimers Disease Pathology and Early Detection at the NSLS with Infrared, XRF, and DEI". United States.
@article{osti_959973,
title = {Probing Alzheimers Disease Pathology and Early Detection at the NSLS with Infrared, XRF, and DEI},
author = {Zhong, Z and Bennett, D and Chapman, D and Chen, J and Connor, D and Dilmanian, A and Faulconer, L and Kao, T and Leskovjan, A and et al},
abstractNote = {We explored diffraction enhanced imaging (DEI) in both planar and computed tomography (CT) modes for early detection of beta amyloid deposition, a hallmark feature in Alzheimer's disease (AD). Since amyloid plaques precede clinical symptoms by years, their early detection is of great interest. These findings were correlated with results from synchrotron infrared microspectroscopic imaging and X-ray fluorescence microscopy, to determine the secondary structure of the amyloid beta protein and metal concentration in the amyloid plaques, respectively.},
doi = {},
url = {https://www.osti.gov/biblio/959973}, journal = {Synchrotron Radiation News},
number = 3,
volume = 21,
place = {United States},
year = {Tue Jan 01 00:00:00 EST 2008},
month = {Tue Jan 01 00:00:00 EST 2008}
}