Length Scale Discontinuities Between Non-Crystalline And Nano-Crystalline Thin Films: Chemical Bonding Self-Organization, Broken Constraints And Reductions of Macroscopic Strain
This paper identifies different length scales, {lambda}{sub s}, for strain-reducing chemical bonding self-organizations in non-crystalline and nano-crystalline thin films. Length scales have been identified through spectroscopic studies, thermal heat flow measurements, and are analyzed by semi-empirical bond-constraint theory (SE-BCT) and symmetry adapted linear combinations (SALC) of atomic states. In both instances, strain-reducing self-organizations result in reduced defect densities that are minimized and enabling for device applications. The length scale for non-crystalline solids extends to at most 1 nm, and more generally to 0.5-0.8 nm; however, there are two different length scales for nano-crystalline films: one is <2.5 nm and is characterized by suppression of longer range ordering required for complex unit cells based on more than one primitive unit cell and the second is >3-3.5 nm and defines a regime where complex unit cells, comprised of two or more primitive unit cells are stabilized and the electronic structure is changed.
- Research Organization:
- SLAC National Accelerator Lab., Menlo Park, CA (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- AC02-76SF00515
- OSTI ID:
- 953097
- Report Number(s):
- SLAC-REPRINT-2009-187; JNCSBJ; TRN: US200914%%195
- Journal Information:
- J. Noncryst. Solids 354:2702,2008, Vol. 354, Issue 19-25; ISSN 0022-3093
- Country of Publication:
- United States
- Language:
- English
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