Quantitative characterization of the contrast mechanisms of ultra-small angle x-ray scattering imaging.
A general treatment of X-ray imaging contrast for ultra-small-angle X-ray scattering (USAXS) imaging is presented; this approach makes use of phase propagation and dynamical diffraction theory to account quantitatively for the intensity distribution at the detector plane. Simulated results from a model system of micrometer-sized spherical SiO{sub 2} particles embedded in a polypropylene matrix show good agreement with experimental measurements. Simulations by means of a separate geometrical ray-tracing method also account for the features in the USAXS images and offer a complementary view of small-angle X-ray scattering as a contrast mechanism. The ray-tracing analysis indicates that refraction, in the form of Porod scattering, and, to a much lesser extent, X-ray reflection account for the USAXS imaging contrast.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC)
- DOE Contract Number:
- DE-AC02-06CH11357
- OSTI ID:
- 927736
- Report Number(s):
- ANL/XSD/JA-59911; JACGAR; TRN: US200816%%1187
- Journal Information:
- Acta Crystallogr. A, Vol. 41, Issue Apr. 2008; ISSN 0021-8898
- Country of Publication:
- United States
- Language:
- ENGLISH
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