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Title: Beam Profile Monitor With Accurate Horizontal And Vertical Beam Profiles

A widely used scanner device that rotates a single helically shaped wire probe in and out of a particle beam at different beamline positions to give a pair of mutually perpendicular beam profiles is modified by the addition of a second wire probe. As a result, a pair of mutually perpendicular beam profiles is obtained at a first beamline position, and a second pair of mutually perpendicular beam profiles is obtained at a second beamline position. The simple modification not only provides more accurate beam profiles, but also provides a measurement of the beam divergence and quality in a single compact device.
Authors:
 [1] ;  [2]
  1. Knoxville, TN
  2. Oak Ridge, TN
Publication Date:
OSTI Identifier:
880206
Report Number(s):
6,972,551
US patent application 10/673715
DOE Contract Number:
AC05-00OR22725
Resource Type:
Patent
Research Org:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English