Analysis of systems hardware flown on LDEF. Results of the systems special investigation group

Technical Report · Wed Apr 01 00:00:00 EST 1992

OSTI ID:7225852

Dursch, H W; Spear, W S; Miller, E A; Bohnhoff-Hlavacek, G L; Edelman, J

The Long Duration Exposure Facility (LDEF) was retrieved after spending 69 months in low Earth orbit (LEO). LDEF carried a remarkable variety of mechanical, electrical, thermal, and optical systems, subsystems, and components. The Systems Special Investigation Group (Systems SIG) was formed to investigate the effects of the long duration exposure to LEO on systems related hardware and to coordinate and collate all systems analysis of LDEF hardware. Discussed here is the status of the LDEF Systems SIG investigation through the end of 1991.

• Research Organization: Boeing Co., Seattle, WA (United States)
• OSTI ID: 7225852
• Report Number(s): N-92-31677; NASA-CR-189628; NAS-1.26:189628; CNN: NAS1-19247; RTOP 506-48-91-08
• Resource Relation: Other Information: Original contains color illustrations
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
ELECTRONIC EQUIPMENT
PHYSICAL RADIATION EFFECTS
OPTICAL EQUIPMENT
CONTAMINATION
COORDINATES
FAILURES
FASTENERS
LUBRICANTS
SATELLITES
SOLAR CELLS
SOLAR RADIATION
SPACE FLIGHT
SPACECRAFT POWER SUPPLIES
SYSTEMS ANALYSIS
TEMPERATURE CONTROL
CONTROL
DIRECT ENERGY CONVERTERS
EQUIPMENT
PHOTOELECTRIC CELLS
PHOTOVOLTAIC CELLS
POWER SUPPLIES
RADIATION EFFECTS
RADIATIONS
SOLAR EQUIPMENT
STELLAR RADIATION
440200* - Radiation Effects on Instrument Components
Instruments
or Electronic Systems