Dimensions of luminescent oxidized and porous silicon structures
Journal Article
·
· Physical Review Letters; (United States)
- AT T Bell Laboratories, Murray Hill, New Jersey 07974 (United States) National Center for Electron Microscopy, Lawrence Berkeley Laboratory, Berkeley, California 94720 (United States)
X-ray absorption measurements from H-passivated porous Si and from oxidized Si nanocrystals, combined with electron microscopy, ir absorption, [alpha] recoil, and luminescence emission data, provide a consistent structural picture of the species responsible for the visible luminescence observed in these samples. The mass-weighted average structures in por-Si are particles, not wires, with dimensions significantly smaller than previously reported or proposed.
- DOE Contract Number:
- AC03-76SF00098
- OSTI ID:
- 7207445
- Journal Information:
- Physical Review Letters; (United States), Vol. 72:16; ISSN 0031-9007
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
SILICON
MICROSTRUCTURE
ABSORPTION SPECTRA
ELECTRON MICROSCOPY
HYDROGENATION
INFRARED SPECTRA
OXIDATION
PHOTOLUMINESCENCE
POROUS MATERIALS
X-RAY SPECTROSCOPY
CHEMICAL REACTIONS
ELEMENTS
LUMINESCENCE
MATERIALS
MICROSCOPY
SEMIMETALS
SPECTRA
SPECTROSCOPY
360602* - Other Materials- Structure & Phase Studies
360606 - Other Materials- Physical Properties- (1992-)
665100 - Nuclear Techniques in Condensed Matter Physics - (1992-)
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
SILICON
MICROSTRUCTURE
ABSORPTION SPECTRA
ELECTRON MICROSCOPY
HYDROGENATION
INFRARED SPECTRA
OXIDATION
PHOTOLUMINESCENCE
POROUS MATERIALS
X-RAY SPECTROSCOPY
CHEMICAL REACTIONS
ELEMENTS
LUMINESCENCE
MATERIALS
MICROSCOPY
SEMIMETALS
SPECTRA
SPECTROSCOPY
360602* - Other Materials- Structure & Phase Studies
360606 - Other Materials- Physical Properties- (1992-)
665100 - Nuclear Techniques in Condensed Matter Physics - (1992-)