Impact-parameter dependence of energy loss for 625-keV H[sup +] ions in Si single crystals
- Department of Physics, University of Florida, P.O. Box 118440, Gainesville, Florida 32611-8440 (United States)
- Institute of Nuclear Physics, Moscow State University, 119899 Moscow (Russian Federation)
The energy distributions for 625-keV H[sup +] ions transmitted through thin Si single crystals are studied for detailed angular scans through the [l angle]110[r angle] and [l angle]100[r angle] axial as well as the [l brace]111[r brace] and [l brace]110[r brace] planar channels. Well-resolved structures in the distributions taken near the [l angle]110[r angle] axial direction are observed. The experimental energy-loss distributions are very well reproduced by a Monte Carlo simulation using the semiclassical approximation model for core electrons and the two-component free-electron-gas model for valence electrons. The best fit to the data is obtained if the model energy losses are scaled up for core electrons and down for valence electrons by several percent. The experimental distributions can also be reproduced by assuming the mean excitation energy for distant collisions of the ion with core electrons equal to 1.4 times the binding energy for a given shell. No significant differences between the distributions obtained using the solid-state and free-atom valence electron densities have been found. The evolution of the distributions for the [l angle]110[r angle] axial scan is discussed in terms of ion trajectories and the flux distribution. Also, the azimuthally averaged mean energy loss is studied as a function of tilt angle with respect to the [l angle]110[r angle] axis.
- OSTI ID:
- 6847138
- Journal Information:
- Physical Review A; (United States), Vol. 50:6; ISSN 1050-2947
- Country of Publication:
- United States
- Language:
- English
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SUPERCONDUCTIVITY AND SUPERFLUIDITY
HYDROGEN IONS 1 PLUS
ENERGY LOSSES
ENERGY SPECTRA
SILICON
ION CHANNELING
ANGULAR DISTRIBUTION
IMPACT PARAMETER
INNER-SHELL EXCITATION
ION SPECTROSCOPY
KEV RANGE 100-1000
MONOCRYSTALS
SENSITIVITY
CATIONS
CHANNELING
CHARGED PARTICLES
CRYSTALS
DISTRIBUTION
ELEMENTS
ENERGY RANGE
ENERGY-LEVEL TRANSITIONS
EXCITATION
HYDROGEN IONS
IONS
KEV RANGE
LOSSES
SEMIMETALS
SPECTRA
SPECTROSCOPY
665300* - Interactions Between Beams & Condensed Matter- (1992-)