Excitation rates for plasma impurity measurements by x-ray diagnostics

Journal Article · Mon Aug 01 00:00:00 EDT 1988 · Rev. Sci. Instrum.; (United States)

DOI:https://doi.org/10.1063/1.1140072· OSTI ID:6838032

Hill, K W; Bitter, M; von Goeler, S; Hsuan, H; Hulse, R; Johnson, L C; Lasalle, P; McGuire, K S; Murphy, A; Stevens, J E; others, and

Measurement of intrinsic and injected impurity concentrations and transport in tokamak plasmas by x-ray pulse-height analysis (PHA) and x-ray imaging (XI) diode arrays requires reliable excitation rates for a number of charge states of a range of elements (Al, Se, Ti, Cr, Fe, Ni, Ge, etc.). Previous PHA measurements at Princeton have relied on a coronal-equilibrium average of excitation rates for iron, and a prescription for scaling the average rate to nearby elements. For improved accuracy in PHA measurements (using the MIST impurity equilibrium and transport code) and for interpretation of XI data (using an x-ray simulation code), rates for excitation of dominant charge states by electron impact, dielectronic recombination, and radiative recombination have been calculated from available atomic data and parametrized as a function of atomic number (Z = 10--42) and electron temperature (T/sub e/ = 0.1--10.0 keV).

• Research Organization: Princeton University Plasma Physics Laboratory, Princeton, New Jersey 08544
• OSTI ID: 6838032
• Journal Information: Rev. Sci. Instrum.; (United States), Vol. 59:8
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
PLASMA DIAGNOSTICS
X RADIATION
ATOMIC IONS
ELECTRON TEMPERATURE
IMPURITIES
M CODES
PULSE TECHNIQUES
RECOMBINATION
SEMICONDUCTOR DIODES
TRANSPORT THEORY
CHARGED PARTICLES
COMPUTER CODES
ELECTROMAGNETIC RADIATION
IONIZING RADIATIONS
IONS
RADIATIONS
SEMICONDUCTOR DEVICES
700102* - Fusion Energy- Plasma Research- Diagnostics