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Title: Forsterite film formation and grain growth in 3% Si steel

Conference · · IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States)
OSTI ID:6658720
;  [1]
  1. Cia Acos Especiais Itabira, Timoteo (Brazil)

The forsterite film in 3% Si steel is formed by a solid state reaction of the annealing separator, MgO, with SiO[sub 2] that results from the reduction of the fayalite layer in the hydrogen atmosphere in the high temperature anneal. In this work, secondary recrystallization was about complete at 1,000 C. After that temperature tertiary recrystallization can occur if the boundary drag of the second phase particles can be overcome. Addition of phosphates to the annealing separator affects the morphology of the forsterite film and can have an important effect on tertiary recrystallization by affecting the rate of decrease of the boundary-drag and/or the surface energy relationship.

OSTI ID:
6658720
Report Number(s):
CONF-940629-; CODEN: IEMGAQ
Journal Information:
IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States), Vol. 30:6Pt1; Conference: Intermag: 6th joint conference on magnetism and magnetic materials, Albuquerque, NM (United States), 20-23 Jun 1994; ISSN 0018-9464
Country of Publication:
United States
Language:
English