VLSI reliability

Book · Mon Jan 01 00:00:00 EST 1990

OSTI ID:6380199

Sabnis, A G ^[1]

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1. AT and T Bell Laboratories, Allentown, PA (US)

This book presents major topics in IC reliability from basic concepts to packaging issues. Other topics covered include failure analysis techniques, radiation effects, and reliability assurance and qualification. This book offers insight into the practical aspects of VLSI reliability.

• OSTI ID: 6380199
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
INTEGRATED CIRCUITS
RELIABILITY
DESIGN
MICROSTRUCTURE
QUALITY ASSURANCE
CRYSTAL STRUCTURE
ELECTRONIC CIRCUITS
MICROELECTRONIC CIRCUITS
426000* - Engineering- Components
Electron Devices & Circuits- (1990-)