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Title: Ion beam analysis

A new ion beam analysis facility has recently been installed at a Van de Graaff accelerator. Its use is expected to support many energy and environmental research projects. Material composition and spatial distribution analyses at the facility are based upon Rutherford backscattering spectrometry, particle-induced X-ray emission, and particle-induced gamma-ray emission analysis. An overview of these three techniques is presented in this article.
Authors:
 [1]
  1. (Dept. of Chemistry, Univ. of Kentucky, KY (US))
Publication Date:
OSTI Identifier:
6378492
Resource Type:
Journal Article
Resource Relation:
Journal Name: Energeia (Lexington, Kentucky); (USA); Journal Volume: 1:5
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; 37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; BACKSCATTERING; ION BEAMS; TEST FACILITIES; VAN DE GRAAFF ACCELERATORS; EMISSION SPECTRA; GAMMA RADIATION; ION EMISSION; MATERIALS TESTING; PIXE ANALYSIS; RESEARCH PROGRAMS; ACCELERATORS; BEAMS; CHEMICAL ANALYSIS; ELECTROMAGNETIC RADIATION; ELECTROSTATIC ACCELERATORS; IONIZING RADIATIONS; NONDESTRUCTIVE ANALYSIS; RADIATIONS; SCATTERING; SPECTRA; TESTING; X-RAY EMISSION ANALYSIS 430301* -- Particle Accelerators-- Ion Sources; 430200 -- Particle Accelerators-- Beam Dynamics, Field Calculations, & Ion Optics; 640301 -- Atomic, Molecular & Chemical Physics-- Beams & their Reactions; 400101 -- Activation, Nuclear Reaction, Radiometric & Radiochemical Procedures