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Title: Method for improving x-ray diffraction determinations of residual stress in nickel-base alloys

A process for improving the technique of measuring residual stress by x-ray diffraction in pieces of nickel-base alloys is discussed. Part of a predetermined area of the surface of a nickel-base alloy is covered with a dispersion. This exposes the covered and uncovered portions of the surface of the alloy to x-rays by way of an x-ray diffractometry apparatus, making x-ray diffraction determinations of the exposed surface, and measuring the residual stress in the alloy based on these determinations. The dispersion is opaque to x-rays and serves a dual purpose, since it masks off unsatisfactory signals such that only a small portion of the surface is measured, and it supplies an internal standard by providing diffractogram peaks comparable to the peaks of the nickel alloy so that the alloy peaks can be very accurately located regardless of any sources of error external to the sample. 2 figs.
Authors:
;
Publication Date:
OSTI Identifier:
6361577
Report Number(s):
PATENTS-US-A7186422
ON: DE89009593
DOE Contract Number:
AC11-76PN00014
Resource Type:
Patent
Resource Relation:
Other Information: Portions of this document are illegible in microfiche products
Research Org:
Bettis Atomic Power Lab., West Mifflin, PA (USA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; NICKEL BASE ALLOYS; RESIDUAL STRESSES; MEASURING METHODS; SURFACES; X-RAY DIFFRACTION; ALLOYS; COHERENT SCATTERING; DIFFRACTION; NICKEL ALLOYS; SCATTERING; STRESSES 360103* -- Metals & Alloys-- Mechanical Properties; 656002 -- Condensed Matter Physics-- General Techniques in Condensed Matter-- (1987-)