Determination of the spatial extension of the surface-plasmon evanescent field of a silver film with a photon scanning tunneling microscope

Journal Article · Thu Jul 15 00:00:00 EDT 1993 · Physical Review, B: Condensed Matter; (United States)

DOI:https://doi.org/10.1103/PhysRevB.48.2680· OSTI ID:6327732

Adam, P M; Salomon, L; de Fornel, F; Goudonnet, J P ^[1]

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1. Laboratoire Physique du Solide, Equipe Optique Submicronique, Universite de Bourgogne, Faculte de Sciences Mirande, Boite Postale 138, 21004 Dijon Cedex (France)

A photon scanning tunneling microscope is employed to probe the surface-plasmon field in the evanescent region of a silver film for [ital p] (parallel to the plane of incidence) and [ital s] (perpendicular to the plane of incidence) polarizations of the light beam at several angles of incidence near the critical angle. The interaction between the field and the probe is measured and compared to theoretical calculations involving a single four-media model. A systematic analysis of images obtained for several positions of the optical fiber above the film is presented and it is shown that, for tip-to-sample distances smaller than half the wavelength of the incoming light, the collected intensity curves are identical in any area of the sample.

• OSTI ID: 6327732
• Journal Information: Physical Review, B: Condensed Matter; (United States), Vol. 48:4; ISSN 0163-1829
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
PLASMONS
SPATIAL DISTRIBUTION
SILVER
FIBER OPTICS
POLARIZATION
REFLECTION
THIN FILMS
DISTRIBUTION
ELEMENTS
FILMS
METALS
QUASI PARTICLES
TRANSITION ELEMENTS
665200* - Solid-State Plasma- (1992-)