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Title: An investigation into the use of electron back scattered diffraction to measure recrystallized fraction

Journal Article · · Scripta Materialia
;  [1]
  1. Univ. of Sheffield (United Kingdom). Dept. of Engineering Materials

The Electron Back-Scattered Diffraction (EBSD) technique is in its infancy and is a highly promising area of development. Use of EBSD has been predominantly for the determination of crystallographic textures. Other applications have also been considered, which include: crystal structure determination, phase determination, grain boundary studies and both elastic and plastic deformation measurement. Although it has been acknowledged that an important use of the EBSD could be in the measurement of recrystallization and its kinetics there are a number of inherent problems with such measurements using EBSD. These problems include the ability of the system to index deformed microstructures even those on a fine scale, the difficulties of analyzing patterns in the region of grain boundaries and the problems of sample preparation which is critical in the quality of the diffraction patterns obtained. The aim of the present study is to determine whether it is possible to measure the volume fraction recrystallized using EBSP of partially recrystallized stainless steel. This has been done by investigation of the quality of matching between the observed and calculated diffraction patterns, and the quality of the observed patterns measured in terms of their contrast. The material used was stainless steel 316L.

OSTI ID:
6306009
Journal Information:
Scripta Materialia, Vol. 41:2; ISSN 1359-6462
Country of Publication:
United States
Language:
English