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Title: Radiative interactions with micromachined surfaces: Spectral polarized emittance

The spectral, angular, polarized emittance (SAPE) is a simple means for observing the allowed electromagnetic energy states associated with periodic structures whose dimensions are comparable to the wavelength of the observed light. Other methods for measuring absorption are far more time consuming when a broad survey is of interest. An extensive body of SAPE data was obtained on 350-- 400{degrees}C intrinsic silicon lamellar gratings. Current approximations to the vector wave equation such as guided wave, modal and Bloch wave methods provided insight into our experiments. A qualitative picture of the stationary electromagnetic states (SES) of lamellar gratings has been developed which agrees with experiment for a number of polarizations, and angular orientations of the emission k vector relative to the gratings. However, one type of emission does not fit any simple model we have examined and raises intriguing questions about emission from grating structures. A new, higher angular resolution emissometer (0.8{degrees} instead of 5{degrees}) has been completed. This system significantly increases the wavelength range from the current 3--14 {mu}m range to 2-25{mu}m, a doubling of the spectral regime. The system is currently in a shakedown'' mode. Preliminary data indicates that the new emissometer meets the design goals. 24 refs., 10more » figs.« less
Authors:
Publication Date:
OSTI Identifier:
6257052
Report Number(s):
DOE/ER/13964-3; CONF-9105275--1
ON: DE92001742
DOE Contract Number:
FG02-88ER13964
Resource Type:
Conference
Resource Relation:
Conference: Micro-macro studies of multiphase media, Argonne, IL (United States), 9-11 May 1991
Research Org:
Pennsylvania Univ., Philadelphia, PA (United States). Dept. of Electrical Engineering
Sponsoring Org:
DOE; USDOE, Washington, DC (United States)
Country of Publication:
United States
Language:
English
Subject:
74 ATOMIC AND MOLECULAR PHYSICS; 36 MATERIALS SCIENCE; SILICON; EMISSIVITY; ANALYTICAL SOLUTION; DIFFRACTION GRATINGS; ELECTROMAGNETIC RADIATION; ELLIPSOMETERS; HIGH TEMPERATURE; MEASURING METHODS; POLARIZATION; PROGRESS REPORT; SURFACES; THERMAL RADIATION; DOCUMENT TYPES; ELEMENTS; GRATINGS; MEASURING INSTRUMENTS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; POLARIMETERS; RADIATIONS; SEMIMETALS; SURFACE PROPERTIES 664200* -- Spectra of Atoms & Molecules & their Interactions with Photons-- (1992-); 360606 -- Other Materials-- Physical Properties-- (1992-)