skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Electro-optical characterization of Pb(Zr,Ti)O[sub 3] thin films by waveguide refractometry

Journal Article · · Applied Physics Letters; (United States)
DOI:https://doi.org/10.1063/1.110576· OSTI ID:6253004
; ;  [1]
  1. Sandia National Laboratories, Albuquerque, New Mexico 87185 (United States)

Electric field-induced changes in the extraordinary and ordinary refractive indices of a Pb(Zr[sub 0.53]Ti[sub 0.47])O[sub 3] thin film were independently determined using waveguide refractometry. Under an electric field, applied normal to the film plane and corresponding to saturation of the electric polarization, the ratio of the extraordinary to ordinary refractive index change ([Delta][ital n][sub [ital e]]/[Delta][ital n][sub [ital o]]) is found to be [minus]4/1, contributing to a net birefringence change [[Delta]([ital n][sub [ital e]]-[ital n][sub [ital o]])] of [minus]0.021. Using this technique, both diagonal and off-diagonal elements of the electro-optic response tensor describing the macroscopic behavior of the polycrystalline film were accessed, illustrating the importance of this approach in evaluating orientation-specific electro-optic characteristics in these films.

DOE Contract Number:
AC04-76DP00789
OSTI ID:
6253004
Journal Information:
Applied Physics Letters; (United States), Vol. 63:16; ISSN 0003-6951
Country of Publication:
United States
Language:
English