Electro-optical characterization of Pb(Zr,Ti)O[sub 3] thin films by waveguide refractometry
- Sandia National Laboratories, Albuquerque, New Mexico 87185 (United States)
Electric field-induced changes in the extraordinary and ordinary refractive indices of a Pb(Zr[sub 0.53]Ti[sub 0.47])O[sub 3] thin film were independently determined using waveguide refractometry. Under an electric field, applied normal to the film plane and corresponding to saturation of the electric polarization, the ratio of the extraordinary to ordinary refractive index change ([Delta][ital n][sub [ital e]]/[Delta][ital n][sub [ital o]]) is found to be [minus]4/1, contributing to a net birefringence change [[Delta]([ital n][sub [ital e]]-[ital n][sub [ital o]])] of [minus]0.021. Using this technique, both diagonal and off-diagonal elements of the electro-optic response tensor describing the macroscopic behavior of the polycrystalline film were accessed, illustrating the importance of this approach in evaluating orientation-specific electro-optic characteristics in these films.
- DOE Contract Number:
- AC04-76DP00789
- OSTI ID:
- 6253004
- Journal Information:
- Applied Physics Letters; (United States), Vol. 63:16; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
PZT
ELECTRO-OPTICAL EFFECTS
ANISOTROPY
BIREFRINGENCE
POLARIZATION
REFRACTIVE INDEX
THIN FILMS
WAVEGUIDES
FILMS
LEAD COMPOUNDS
OPTICAL PROPERTIES
OXYGEN COMPOUNDS
PHYSICAL PROPERTIES
REFRACTION
TITANATES
TITANIUM COMPOUNDS
TRANSITION ELEMENT COMPOUNDS
ZIRCONATES
ZIRCONIUM COMPOUNDS
360204* - Ceramics
Cermets
& Refractories- Physical Properties