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Title: Progress in semiconductor drift detectors

Progress in testing semiconductor drift detectors is reported. Generally better position and energy resolutions were obtained than resolutions published previously. The improvement is mostly due to new electronics better matched to different detectors. It is shown that semiconductor drift detectors are becoming versatile and reliable detectors for position and energy measurements.
Authors:
; ; ; ; ; ; ; ; ;
Publication Date:
OSTI Identifier:
6201733
Report Number(s):
BNL-37358; CONF-851009-60
ON: DE86006246
DOE Contract Number:
AC02-76CH00016
Resource Type:
Conference
Resource Relation:
Conference: IEEE nuclear science symposium, San Francisco, CA, USA, 23 Oct 1985; Other Information: Portions of this document are illegible in microfiche products
Research Org:
Brookhaven National Lab., Upton, NY (USA); Lawrence Berkeley Lab., CA (USA); Politecnico di Milano (Italy). Dipartimento di Elettronica; Technische Univ. Muenchen, Garching (Germany, F.R.). Fakultaet fuer Physik; Max-Planck-Institut fuer Physik und Astrophysik, Muenchen (Germany, F.R.)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; SEMICONDUCTOR DETECTORS; PERFORMANCE TESTING; ENERGY RESOLUTION; POSITION SENSITIVE DETECTORS; SPATIAL RESOLUTION; TEMPERATURE DEPENDENCE; MEASURING INSTRUMENTS; RADIATION DETECTORS; RESOLUTION; TESTING 440101* -- Radiation Instrumentation-- General Detectors or Monitors & Radiometric Instruments