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Title: Tests of wire chamber ageing with CF/sub 4//isobutane (80:20), argon/ethane (50:50), and argon/ethane/CF/sub 4/ (48:48:4)

Conference · · IEEE Trans. Nucl. Sci.; (United States)
OSTI ID:6177155

In a series of parallel tests the aging characteristics of CF/sub 4//Isobutane (80:20), Argon/Ethane/CF/sub 4/ (48:48:4), have been investigated. Parameters such as flow rate, gas gain, anode wire current density, and materials in contact with the gas stream have been varied. Some tests have been extended beyond 8 Coulomb/cm of wire. The Ar/Et chambers have shown a high incidence of pulse height degradation, dark currents, cathode foil etching, and deposits on the electrodes. A strong correlation between anode wire current density and rate of damage (%/C/cm) is indicated for Ar/Et chambers. The CF/sub 4//Iso chambers have shown effectively zero pulse height degradation and few other problems to accumulated charges exceeding 5 C/cm, except for one low-flow chamber with some cathode etching and cathode related pulse height degradation. The addition of 4% CF/sub 4/ to the Ar/Et mixture has dramatically improved the aging performance of the Ar/Et/CF/sub 4/ cells.

Research Organization:
Univ. of Melbourne (AU); TRIUMF, 4004 Wesbrook Mall, Vancouver, BC (CA)
OSTI ID:
6177155
Report Number(s):
CONF-881103-
Journal Information:
IEEE Trans. Nucl. Sci.; (United States), Vol. 36:1; Conference: IEEE nuclear science symposium, Orlando, FL, USA, 9 Nov 1988
Country of Publication:
United States
Language:
English